Advanced Photon Source at Argonne National Laboratory   APS USAXS instrument
USAXS instrument at the Advanced Photon Source,
X-ray science division, beamline 32ID

Advanced Photon Source

A U.S. Department of Energy, Office of Science,
Office of Basic Energy Sciences national synchrotron x-ray research facility

 
 
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Schedule
Staff web pages:
      Jan Ilavsky, inst. scientist
Documentation

      Glassy Carbon int. stnd.
      Example data reduction
      Example USAXS data
      Getting beam time
      Instrument Geometries
      USAXS imaging
      Overview
      Posters
      Sample Holders
      Select publications
      User publications
              prior 2000
              2000
              2001
              2002
              2003
              2004
              2005
              2006
              2007
              2008
              dissertations
      Shipping Address
Live USAXS data
Live USAXS cameras
Photo Gallery
Newsletters
Software by Jan Ilavsky:
      Indra (reduction)
      Irena (analysis)
      Nika (2D data reduction)
      Cromer-Liberman AtFF
      other macros
Useful WWW links


APS 32ID-B USAXS
Ultra-Small-Angle X-ray Scattering Facility

instrument scientist: Jan Ilavsky, 630-252-0866, ilavsky@anl.gov

Select publications

When you need to cite this instrument in a publication, (keep in mind when you publish your work based on data acquired at USAXS, you must include the standard APS acknowledgement in your publication, poster, thesis, etc.) please choose amongst these references:
UNICAT USAXS 1-D collimation geometry
G. G. Long, A. J. Allen, J. Ilavsky, P. R. Jemian, and P. Zschack,
The Ultra-Small-Angle X-ray Scattering Instrument on UNICAT at the APS,
in SRI99: Eleventh U.S. National Synchrotron Radiation Instrumentation Conference, AIP Conference Proceedings CP521,
editors P. Pianetta, J. Arthur, and S. Brennan, Stanford Linear Accelerator Center, Stanford, CA, 2000 (New York: American Institute of Physics), pp. 183-187.
UNICAT USAXS 2-D collimation geometry
J. Ilavsky, A. Allen, G. Long, and P. Jemian,
Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures,
Review of Scientific Instruments 73, (2002) 1660-1662.
absolute intensity calibration, USAXS data reduction, slit desmearing
G.G. Long, P.R. Jemian, J.R. Weertman, D.R. Black, H.E. Burdette, and R. Spal;
High Resolution Small-Angle X-ray Scattering Camera for Anomalous Scattering

J Appl Cryst 24 (1991) 30-37.
photodiode detector
P.R. Jemian and G.G. Long;
J Appl Cryst 23 (1990) 430-432.

        

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This page last modified: 2006-09-28 10:54 AM