APS 32ID-B USAXS
Ultra-Small-Angle X-ray Scattering Facility
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| instrument scientist: Jan Ilavsky, 630-252-0866, ilavsky@anl.gov |
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Examples of USAXS data
Silica spheres in solution
| Slit smeared configuration, “rocking-curve data”. These data are photodiode intensity (divided by monitor ion chamber intensity) as a function of Q vector. The data are corrected for photodiode/amplifier dark current, but no other correction is done. |
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| The data for silica spheres in solution after all corrections – after subtracting blank from the sample measurement, calibration and desmearing. |
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| The same data as above measured on pin hole collimated instrument (SBUSAXS). First the rocking-curve data. |
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| The data from above, blank subtracted from the sample measurement, calibrated, this time no desmearing routine was needed. |
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Glassy Carbon
Absolute intensity conversion
For details of the conversion of raw intensity to absolute units of differential scattering cross-section per unit volume per solid angle, please consult:
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