Advanced Photon Source at Argonne National Laboratory   APS USAXS instrument
USAXS instrument at the Advanced Photon Source,
X-ray science division, beamline 32ID

Advanced Photon Source

A U.S. Department of Energy, Office of Science,
Office of Basic Energy Sciences national synchrotron x-ray research facility

 
 
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Schedule
Staff web pages:
      Jan Ilavsky, inst. scientist
Documentation

      Glassy Carbon int. stnd.
      Example data reduction
      Example USAXS data
      Getting beam time
      Instrument Geometries
      USAXS imaging
      Overview
      Posters
      Sample Holders
      Select publications
      User publications
              prior 2000
              2000
              2001
              2002
              2003
              2004
              2005
              2006
              2007
              2008
              dissertations
      Shipping Address
Live USAXS data
Live USAXS cameras
Photo Gallery
Newsletters
Software by Jan Ilavsky:
      Indra (reduction)
      Irena (analysis)
      Nika (2D data reduction)
      Cromer-Liberman AtFF
      other macros
Useful WWW links


APS 32ID-B USAXS
Ultra-Small-Angle X-ray Scattering Facility

instrument scientist: Jan Ilavsky, 630-252-0866, ilavsky@anl.gov

Publications from year 2001

X-ray scattering and imaging from plastically deformed metals. New ultra-small-angle X-ray scattering (USAXS) facilities at third generation synchrotron sources enjoy an additional one to three decades of X-ray brilliance over second generation instruments, and can now quantify microstructural features from 3 nm to 1.3 mum in size. These developments offer exciting possibilities for further exploration of dislocation and other deformation microstructures. To the portfolio of existing techniques we now add a promising experimental window, USAXS imaging, in which high angular resolution images are acquired at scattering vectors related to the observed microstructures. Early results from this ultra-sensitive technique indicate that the arrangements of creep cavities in mildly deformed polycrystalline copper can be observed on many length scales, and the results can be compared with the size distributions derived from a USAXS analysis. Many of the features observed in USAXS imaging are not seen using other existing experimental techniques. Published by Elsevier Science B.V.

G.G. Long, L.E. Levine and R.J. Fields. Cited: Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2001, 309 Jul, p 28-31.

National Institute of Standards and Technology Synchrotron Radiation Facilities for Materials Science. G.G. Long, A. Allen, D.R. Black, H.E. Burdette, D.A. Fisher, R. Spal and J.C. Woicik. Cited: J. Res. Natl. Inst. Stan., 2001, 103 p 1141-1154.

Nano-structural control of catalytic activity in titania doped silica for epoxidation reactions. G. Beaucage, J. Kim, D.J. Kohls, G. Skillas, S. Murugesan, J. Kemper, L. Schecktman, G.G. Long, J. Ilavsky and P.R. Jemian. Cited: Abstracts of Papers of the American Chemical Society, 2001, 222 Aug, p U327-U327.

Ultra-small angle X-ray scattering to detect fatigue damage in polymers. D.A. Baker, L. Pruitt and A. Bellare. Cited: Journal of Materials Science Letters, 2001, 20 (12), p 1163-1164.

 


        

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This page last modified: 2006-09-28 10:54 AM