Jan Ilavsky, Ph.D.

 scientist

X-ray operations division

Argonne National Laboratory

9700S Cass Ave, bldg. 438E

Argonne, IL 60439

Office: +630 252 0866

Fax: +630 252 0862

e-mail: Ilavsky@aps.anl.gov

 

My scientific interests:

Small-angle scattering (SAS) - both X-ray and neutron. I am author of various packages for analysis and data reduction of SAS data - Irena is package which enables to analyse SAS data using number of different methods and also manipulate, graph, import & export data. It also contains package for reflectivity data using Parratt's code.

Further I am interested in plasma sprayed deposits, their microstructure. I am also interested in using other X-ray techniques (reflectivity, tomography, diffraction) for materials science.

First something about me
My background. I come from Czech Republic, originally Czechoslovakia. I got my MS. degree from the oldest university in central Europe - from Charles University, Prague. I joined Institute of Plasma Physics where I developed interest in the thermal spraying and in the thermally sprayed deposits. After "velvet revolution", in 1991, I came to the USA to study for Ph.D at the Department of Materials Science and Engineering, SUNY at Stony Brook, New York, USA. I have studied in the well known "Thermal Spray Laboratory" under the guidance of prof. Christopher C. Berndt and Herbert Herman. I defended my PhD thesis in 1994. Today this laboratory became NSF Center for Thermal Spray Research and we continue to collaborate.
After 1994 I spent two years as post-doc at Materials Characterization Group at Ceramic division of NIST, working with Gabrielle Long, Andrew J. Allen and many other outstanding scientists at NIST on the use of small angle neutron scattering (SANS) for characterization of thermally sprayed deposits. Next stop of my life were two years back at the Institute of Plasma Physics, Academy of Sciences of the Czech Republic, Prague. I continued to broaden my field of interests here into various methods for materials characterization.
From 1999 I was stationed at the Advanced Photon Source, ANL, Chicago, IL - first employed by University of Maryland at College Park, MD, USA and then (as visiting professor) by the Purdue University, Purdue, IN.From July 2004 I am employee of the Argonne National Laboratory, member of X-Ray Operations and Research (XOR), Experimental Facilities Division of Advanced Photon Source.
I am currently the responsible scientist for USAXS instrument.

The major project from my desktop at this time are :
1. Use of small angle X-rays scattering for characterization of anisotropic materials.
2. Studies of polymers structure using small angle X-ray scattering.
3. Use of synchrotron radiation for characterization of engineering materials
4. Grazing angle neutron scattering for studies of anisotropic structures manufactured by TS processes.
5. Impact particles parameters - deposits microstructure relationships for zirconia deposits.
6. Use of small angle neutron scattering for characterization of complex ceramic (metallic, cermet) structures.

Below you can find list of my selected publications. With time I will be adding some of my presentations presented on various conferences and in various institutions, so you can browse them and get better information on my results.

SELECTED PUBLICATIONS:
 

• Renteria AF, Saruhan B, Ilavsky J, Allen AJ. Application of USAXS analysis and non-interacting approximation to determine the influence of process parameters and ageing on the thermal conductivity of electron-beam physical vapor deposited thermal barrier coatings. Surface and Coatings Technology 2007;201:4781.

• Levine LE, Long GG, Ilavsky J, Gerhardt RA, Ou R, Parker CA. Self-assembly of carbon black into nanowires that form a conductive three dimensional micronetwork. Appl Phys Lett 2007;90:014101.

• Kucheyev SO, Toth M, Baumann TF, Hamza AV, Ilavsky J, Knowles WR, Saw CK, Thiel BL, Tileli V, van Buuren T, Wang YM, Willey TM. Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle X-ray scattering. Langmuir 2007;23:353.

• Flores Renteria A, Saruhan B, Ilavsky J, Allen AJ. Application of USAXS Analysis and Non-interacting Approximation to Determine the Influence of Process Parameters and Ageing on the Thermal Conductivity of Electron-Beam Physical Vapor Deposited Thermal Barrier Coatings. Surface and Coatings Technology 2007;201:4781.

• Willey TM, Van Buuren T, Lee JRI, Overturf GE, Kinney JH, Handly J, Weeks BL, Ilavsky J. Changes in pore size distribution upon thermal cycling of TATB-based explosives measured by ultra-small angle X-ray scattering. Propellants, Explosives, Pyrotechnics 2006;31:466.

• Tirumala VR, Ilavsky J, Ilavsky M. Effect of chemical structure on the volume-phase transition in neutral and weakly charged poly(N-alkyl(meth)acrylamide) hydrogels studied by ultrasmall-angle X-ray scattering. J Chem Phys 2006;124.

• Samulon EC, Islam Z, Sebastian SE, Brooks PB, McCourt MK, Ilavsky J, Fisher IR. Low-temperature structural phase transition and incommensurate lattice modulation in the spin-gap compound BaCuSi2O6. Phys Rev B 2006;73.

• Pan GR, Schaefer DW, Ilavsky J. Morphology and water barrier properties of organosilane films: The effect of curing temperature. J Colloid Interf Sci 2006;302:287.

• Kulkarni A, Goland A, Herman H, Allen AJ, Dobbins T, DeCarlo F, Ilavsky J, Long GG, Fang S, Lawton P. Advanced neutron and X-ray techniques for insights into the microstructure of EB-PVD thermal barrier coatings. Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process. 2006;426:43.

• Green ML, Allen AJ, Li X, Wang J, Ilavsky J, Delabie A, Puurunen RL, Brijs B. Nucleation of atomic-layer-deposited HfO2 films, and evolution of their microstructure, studied by grazing incidence small angle x-ray scattering using synchrotron radiation. Appl Phys Lett 2006;88.

• Kulkarni AA, Sampath S, Goland A, Herman H, Allen AJ, Ilavsky J, Gong WQ, Gopalan S. Plasma spray coatings for producing next-generation supported membranes. Top Catal 2005;32:241.

• Kulkarni AA, Goland A, Herman H, Allen AJ, Ilavsky J, Long GG, De Carlo F. Advanced microstructural characterization of plasma-sprayed zirconia coatings over extended length scales. J. Therm. Spray Technol. 2005;14:239.

• Kammler HK, Beaucage G, Kohls DJ, Agashe N, Ilavsky J. Monitoring simultaneously the growth of nanoparticles and aggregates by in situ ultra-small-angle x-ray scattering. J. Appl. Phys. 2005;97.

• Ilavsky J, Allen A, Dobbins T, Kulkarni A, Herman H. Microstructure Characterization of Thermal Barrier Coating Deposits - Practical Models from Measurements. In: Lugscheider E, editor. Thermal Spray Connects: Explore its surfacing potential! Proceedings of the ITSC 2005. Basel, Switzerland: ASM International, 2005.

Selected presentations

MRS presentation 1999 - presented on special session in Honor of 65th birthday of prof. Herman
        Title: Characterization of the complex, anisotropic microstructures of thermally-sprayed ceramic deposits using small-angle scattering techniques – Past, Present and Future.